Evaluation of Temperature for an Electronic Enclosure

DOI : 10.17577/IJERTV4IS060695

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Evaluation of Temperature for an Electronic Enclosure

[1]Ajay Kumar [2] Mrs. Manjula S

[1] M.Tech Student, [2] Assistant Professor Computational analysis in Mechanical Science Department

Government Engineering College Hassan, Karnataka, India

[3] Mr. S Ganesan

[3] Scientist-SG

Thermal System Group, ISRO Satellite Center Bangalore, Karnataka, India

Abstract- The evaluation of temperature for a typical electronic package used in the spacecraft industry has been verified using a lumped modeling methodology including radiation exchange calculation. Electronic enclosure packages constitute various heat dissipating elements mounted on the layered circuit board. The protection of components from thermal damages requires, that can be done by the careful selection of layouts, the dissipation levels which affects the circuit board and various used thermal control methods. ITAS refers to the integrated thermal analysis simulation available in the ISAC for calculation of radiation exchange factor internally, uses Gebhart technique and Monte Carlo Simulation technique. Package level simulation has been done to evaluate the temperature of electronic enclosure and results validated. Results of these thermal analysis are compared with the results given by thermovac tests conducted at ISAC. Under typical operating environmental condition and considerations of conduction and radiation heat transfer modes, temperature levels of the PCB and Components were improved. Based on this thermal analysis variance results suggestions have given to improve the thermal performance of the electronic enclosure packages.

KeywordsEnclosure, Power card, Control card,ITAS, NISA HEAT/FEAP,Electroflo, Contact Conductance, Area Conductance.

  1. INTRODUCTION

    The thermal design of electronic packages ensures the reliability of the packages, getting such a thermal design

    an iterative task. For ex. consider a case of designing an electronic package with PCB with somecomponents on each. Before manufacturing such an electronic packagesthermally feasible layout of all components on the each PCB is required. This is necessary because, when all components aretraced at random and connected properly circuits function well. But when all components placed over specified area PCB, it may not work longer time. This is because, when all electronics components are working hot- spots generated on the PCB due to different power capacities of the chips. When temperature of the hot spots goes beyond the tolerable temperature of the electronic component, the component may fail. Then it is suggested that the chips are to be relocated such that the maximum temperature of the chips arelower. This process is to be repeated until the final temperature of the component lie within the reliable temperatures.

    For better thermal analysis it is necessary to know how the electronic packages are fabricated. Packaging details design of the electronic components to the final assembly stages. The different stages involved in the package design are listed below.

    1. Selection of components.

    2. PC board selection.

    3. Interaction between boards.

    4. Casing (Enclosure) for the electronic package.

    First stage is the selection of the basic components like ICs, resistors, Capacitors etc. Each with unique application.

  2. ELETRONIC ENCLOSURE PACKAGE DETAILS

The Electronic enclosure package is having a PCB along with the various components which is having a different level of heat dissipations. The components of PCB with enclosure is coupled with conductive and radioactive heat transfer mechanisms. The main objective of this work is to evaluate the steady state temperature of this electronic enclosure package. Various effects by the different thermal parameters of the components are also accounted and analyzed.

The enclosure, PCB along with components properties and mounting detail is required to evaluate and analyzed this problem.

A. CONFIGURATION

The package consists of two typical PCB cards mounted on Aluminium housing as shown in fig. PCB houses power card and control card. Power card is mounted first on the turret of the housing and the control card is mounting above the power card separated by the spacers.

Fig.1. Construction details of Electronic Package

B.POWERCARD

The dimensions of the power card are 114 mm X 44 mm with the card thickness of 1.7 mm. The layer configuration of the card consists of high TG FR4 (prepeg) in between two 105 µm thick copper planes on either side of the prepeg. Components are mounted on one side of the card towards the

anodized housing (turret interface). The card is mounted on turret with five nos of M3 screws with silpad as interface material. There are totally eight resisters and 6 mosfets are mounted on the power card. The footprints of all the components is as shown in fig. below.

Fig. 2 Typical PCB power Card

C. CONTROL CARD

The dimensions of the control card are 100 mm X 44 mm with a total card thickness of 1.7 mm, and made up of TG

FR4 prepeg. Control card is connected to the power card at 5 locations with M3 screws and spacers. Dissipation in control card is negligible.

D THERMAL ANALYSIS

The main thermal inputs required for the thermal analysis are the thermal dissipation (constant or varying), PCB card

mounting and size, and the temperature specification limits for the components. The component dissipations in various scenarios are accounted and tabulated as:

Table.1 Dissipation value of Component

Case

Total (W)

Q1

Q2

Q3

Q4

Q5

Q6

1

8.3

0.75

0.75

0.63

0.75

0.75

0.63

R1

R2

R3

R4

R5

R6

R7

R8

0.51

0.51

0.51

0.51

0.51

0.51

0.51

0.51

The main objective of the thermal analysis is to estimate the steady state temperatures of dissipating components and temperature distributions in a typical package. Further feasible thermal suggestions are given as per the requirement.

E THERMAL SPECIFICATIONS

The de-rated temperature specification of the two components in the package is tabulated as:

Table.2: De-rated temperature specification of the package components

Sl. No.

Component

Maximum Dissipation, (W)

Mass (g)

No. Of pins

Type of mounting

Derated value, (°C)

01

MOSFET

0.75

1

3

Flush

110

02

RESISTOR

0.51

0.34

2

Sty cast

115

  1. THERMAL PROPERTIES

    The effective in-plane thermal conductivity (calculated) of Power PCB card is 25 W/m K due to the two copper planes. The leads of the resistor are considered to be Kovar with thermal conductivity of 17.3 W/m K. The PCB and the components coated with conformal coating is considered in the analysis (IR=0.72). The emissivity of 0.6 is considered in the analysis. The thermo-physical property of other materials is given in the table below. The in-plane thermal conductivity of the control PCB is enhance further by adding addition copper planes later.

    Fig.3 Constructional Details of Resistors

    Table.3 Thermo-physical properties of materials used in the package

    Material

    Thermal Conductivity (W/m K)

    Silpad 2000 ( <0.3mm)

    3.5

    Sty cast

    1.0

    High TG FR4

    0.5

    Copper

    390.0

    Aluminium

    168.0

    Fig.4 Constructional Details of Mosfet

  2. BOARD PROPERTIES Name: A Typical Power card Type: PCB

    Material: FR4

    Thermal conductivity: 0.5 W/m0C Board emissivity: 0.72

    Total Power: 8.3 W Length: 114 mm

    Width: 44 mm

    Thickness: 1.7 mm Initial temperature: 300C.

  3. ENCLOSURE PROPERTIES

    Type: Hollow Box type. Total Power: 0W

    Dimensions: 122(X) mm X 50(Y) mm X 50(Z) mm Temperature: 300C

    Thermal conductivity: 168.0 W/m0 C Wall thickness: 1.0 mm.

    Emissivity: 0.56

    1. COMPONENT DETAILS

      Table.4 Component Details

      Source

      Power (W)

      X- Pos (mm)

      Y-Pos (mm)

      Length (mm) or Dia.(For Mosfet)

      Width (mm)

      Height (mm)

      Component Type

      1

      0.75

      7.901

      8.364

      10.36

      Mosfet(Q1)

      2

      0.75

      79.901

      20.817

      10.36

      Mosfet(Q2)

      3

      0.63

      79.482

      33.271

      10.36

      Mosfet(Q3)

      4

      0.75

      56.983

      34.213

      10.36

      Mosfet(Q4)

      5

      0.75

      37.203

      33.69

      10.36

      Mosfet(Q5)

      6

      0.63

      38.041

      7.841

      10.36

      Mosfet(Q6)

      7

      89.073

      12.286

      2.377

      5.271

      2.0

      Resistor(R01)

      8

      89.163

      18.463

      2.616

      5.535

      2.0

      Resistor(R02)

      9

      0.51

      51.802

      22.544

      18.523

      2.5

      2.0

      Resistor(03)

      10

      0.51

      52.325

      16.893

      17.791

      2.5

      2.0

      Resistor(04)

      11

      0.51

      20.721

      11.765

      2.5

      18.314

      2.0

      Resistor(05)

      12

      0.51

      27.21

      11.87

      2.5

      18.419

      2.0

      Resistor(06)

      13

      89.267

      24.951

      2.093

      5.024

      2.0

      Resistor(07)

      14

      65.302

      80.812

      5.337

      2.512

      2.0

      Resistor(08)

      15

      43.849

      35.102

      5.233

      2.302

      2.0

      Resistor(09)

      16

      0.51

      51.593

      11.032

      18.628

      2.5

      2.0

      Resistor(10)

      17

      0.51

      52.64

      5.695

      17.581

      2.5

      2.0

      Resistor(11)

      18

      0.51

      13.919

      11.556

      2.5

      18.733

      2.0

      Resistor(12)

      19

      0.51

      7.326

      11.869

      2.5

      18.419

      2.0

      Resistor(13)

      20

      45.105

      6.533

      5.233

      2.512

      2.0

      Resistor(14)

      21

      89.267

      12.393

      2.198

      4.709

      2.0

      Resistor(15)

      22

      62.267

      20.242

      2.616

      5.128

      2.0

      Resistor(16)

      23

      89.372

      24.847

      2.093

      4.814

      2.0

      Resistor(17)

      24

      65.362

      30.782

      5.023

      2.407

      2.0

      Resistor(18)

      1. RESULTS AND DISCUSSION

        1. RESULTS

          Any thermal design has to ensure appropriate heat flow path between heat dissipating zone (Resisters and Mosfets) and the Sink. This is ensure by the use of thermal interface material

          between components and PCB. In this package the components are mounted on the PCB with sty-cast and silpad and the card is mounted on the package box with silpad.

          The Results are as follows.

          Fig.5 Schematic showing power card, control card and enclosure

          Fig.6 Schematic showing Components Locations and Properties

          Fig.7 Schematic showing the temperature of Enclosure

          Temperature

          Table 5. Results table (Temperature)

          Component

          Analysis Results by Electroflo

          Analysis results by ITAS

          Mosfet

          Q1

          88.3

          83.8

          Q2

          88.8

          84.1

          Q3

          93.2

          89.1

          Q4

          90.3

          88.1

          Q5

          85.8

          83.6

          Q6

          94.3

          91.8

          Resistors

          R1

          82

          69.4

          R2

          83.1

          69.7

          R3

          74.3

          65.7

          R4

          73.8

          62.6

          R5

          83.8

          70.3

          R6

          83.3

          69.5

          R7

          71.7

          59.4

          R8

          70.2

          58.2

          PCB

          51

          49.9

          Fig.8 Result Comparison Graph

        2. DISCUSSIONS

A steady state thermal analysis for a PCB inside an enclosure has been carried out. The PCB was assigned with appropriate material, elements and boundary conditions. Appropriate assignment of thermal material properties for conduction and radiation of the above PCB in an enclosure was made based upon standard values. Isotropic thermal conductivity values for chip, PCB and enclosure are taken for this analysis. The results are within the acceptable level verified by ISAC.

ACKNOWLEDGMENT

This work was performed as part of M.Tech Thesis work and the support received for the same from Thermal Systems Group, ISRO Satellite Center, Bangalore is gratefully acknowledged.

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